Intermittency of Barkhausen avalanche in Co nanothin films
نویسندگان
چکیده
We investigate the statistical distribution of separation time DT between the adjacent two Barkhausen jumps in Co films having the thickness ranging from 5 to 50 nm. By means of a magneto-optical microscope magnetometer, we determine the time-dependent magnetization curve and the separation time DT between two jump events during avalanche process from the directly observed time-resolved domain evolution patterns. Through a statistical analysis of DT , we find that the distribution P(DT) seems to follow a power-law behavior with the same form within the error range, irrespective of the film thickness. © 2004 American Institute of Physics. @DOI: 10.1063/1.1688638#
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